A synchrotron X-ray diffraction deconvolution method for the measurement of residual stress in thermal barrier coatings as a function of depth (2016)
Attributed to:
Next Generation Multi-Dimensional X-Ray Imaging
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1107/s1600576716013935
PubMed Identifier: 27980507
Publication URI: http://europepmc.org/abstract/MED/27980507
Type: Journal Article/Review
Parent Publication: Journal of Applied Crystallography
Issue: 6
ISSN: 0021-8898