Single carrier trapping and de-trapping in scaled silicon complementary metal-oxide-semiconductor field-effect transistors at low temperatures (2017)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/1361-6641/aa6910

Publication URI: http://dx.doi.org/10.1088/1361-6641/aa6910

Type: Journal Article/Review

Parent Publication: Semiconductor Science and Technology

Issue: 7