Electrical properties of n-type 3C-SiC epilayers in situ doped with extremely high levels of phosphorus (2018)
Attributed to:
Creating Silicon Based Platforms for New Technologies
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/1361-6641/aade67
Publication URI: http://dx.doi.org/10.1088/1361-6641/aade67
Type: Journal Article/Review
Parent Publication: Semiconductor Science and Technology
Issue: 11