Reduction of systematic errors in structured light metrology at discontinuities in surface reflectivity (2019)

First Author: Yue H
Attributed to:  The Light Controlled Factory funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.optlaseng.2018.08.002

Publication URI: http://dx.doi.org/10.1016/j.optlaseng.2018.08.002

Type: Journal Article/Review

Parent Publication: Optics and Lasers in Engineering