An improved modified embedded-atom method potential to fit the properties of silicon at high temperature (2018)
Abstract
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Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.commatsci.2018.07.001
Publication URI: http://dx.doi.org/10.1016/j.commatsci.2018.07.001
Type: Journal Article/Review
Parent Publication: Computational Materials Science