Chemical Imaging of Buried Interfaces in Organic-Inorganic Devices Using Focused Ion Beam-Time-of-Flight-Secondary-Ion Mass Spectrometry. (2019)
Attributed to:
Enabling Next Generation Additive Manufacturing
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1021/acsami.8b15091
PubMed Identifier: 30604956
Publication URI: http://europepmc.org/abstract/MED/30604956
Type: Journal Article/Review
Volume: 11
Parent Publication: ACS applied materials & interfaces
Issue: 4
ISSN: 1944-8244