Hot carrier aging and its variation under use-bias: Kinetics, prediction, impact on Vdd and SRAM (2015)
Attributed to:
Time-Dependent Variability: A test-proven modelling approach for systems verification and power consumption minimization
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/iedm.2015.7409742
Publication URI: http://dx.doi.org/10.1109/iedm.2015.7409742
Type: Conference/Paper/Proceeding/Abstract