NBTI of Ge pMOSFETs: Understanding defects and enabling lifetime prediction (2014)
Attributed to:
Time-Dependent Variability: A test-proven modelling approach for systems verification and power consumption minimization
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/iedm.2014.7047166
Publication URI: http://dx.doi.org/10.1109/iedm.2014.7047166
Type: Conference/Paper/Proceeding/Abstract