Investigation of Dayem Bridge NanoSQUIDs Made by Xe Focused Ion Beam (2018)

First Author: Godfrey T
Attributed to:  Integrated Plasma Source Focused Ion Beam with Scanning Electron Microscope funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/tasc.2018.2854624

Publication URI: http://dx.doi.org/10.1109/tasc.2018.2854624

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Applied Superconductivity

Issue: 7

ISSN: 10518223