Ion-beam-induced bending of semiconductor nanowires. (2018)
Attributed to:
In-Situ TEM Studies of Ion-Irradiated Materials
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/1361-6528/aac659
PubMed Identifier: 29781443
Publication URI: http://europepmc.org/abstract/MED/29781443
Type: Journal Article/Review
Volume: 29
Parent Publication: Nanotechnology
Issue: 33
ISSN: 0957-4484