An in situ Method for Preserving Buried Voids and Cracks During TEM Sample Preparation using FIB (2016)
Attributed to:
The University of Manchester - Equipment Account
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1017/s1431927616001781
Publication URI: http://dx.doi.org/10.1017/s1431927616001781
Type: Journal Article/Review
Parent Publication: Microscopy and Microanalysis
Issue: S3