Fourier Analysis of Correlated Monte Carlo Importance Sampling (2019)
Attributed to:
Holey Sampling: Topological Analysis of Sampling Patterns for Assessing Error in High-dimensional Quadrature
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1111/cgf.13613
Publication URI: http://dx.doi.org/10.1111/cgf.13613
Type: Journal Article/Review
Parent Publication: Computer Graphics Forum
Issue: 1