A Dual-Point Technique for the Entire I D -V G Characterization Into Subthreshold Region Under Random Telegraph Noise Condition (2019)
Attributed to:
Time-Dependent Variability: A test-proven modelling approach for systems verification and power consumption minimization
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/led.2019.2903516
Publication URI: http://dx.doi.org/10.1109/led.2019.2903516
Type: Journal Article/Review
Parent Publication: IEEE Electron Device Letters
Issue: 5