Intensity calibration and sensitivity factors for XPS instruments with monochromatic Ag La and Al Ka sources (2019)

First Author: Shard A

Attributed to: University of Nottingham - Equipment Account funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1002/sia.6647

Publication URI: http://dx.doi.org/10.1002/sia.6647

Type: Journal Article/Review

Parent Publication: Surface and Interface Analysis

Issue: 7