An in-situ approach for preparing atom probe tomography specimens by xenon plasma-focussed ion beam. (2019)

First Author: Halpin JE

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.ultramic.2019.04.005

PubMed Identifier: 31005819

Publication URI: http://europepmc.org/abstract/MED/31005819

Type: Journal Article/Review

Volume: 202

Parent Publication: Ultramicroscopy

ISSN: 0304-3991