Robustness and reliability review of Si and SiC FET devices for more-electric-aircraft applications (2019)
Attributed to:
Reliability, Condition Monitoring and Health Management Technologies for WBG Power Modules
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.microrel.2019.06.016
Publication URI: http://dx.doi.org/10.1016/j.microrel.2019.06.016
Type: Journal Article/Review
Parent Publication: Microelectronics Reliability