X-ray induced Sm-ion valence conversion in Sm-ion implanted fluoroaluminate glasses towards high-dose radiation measurement (2019)

First Author: Chicilo F

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1007/s10854-019-01212-4

Publication URI: http://dx.doi.org/10.1007/s10854-019-01212-4

Type: Journal Article/Review

Parent Publication: Journal of Materials Science: Materials in Electronics

Issue: 18