Low-Frequency Noise in Electric Double Layer InGaZnO Thin-Film Transistors Gated with Sputtered SiO 2 -Based Electrolyte (2019)

First Author: Ma X

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1021/acsaelm.9b00141

Publication URI: http://dx.doi.org/10.1021/acsaelm.9b00141

Type: Journal Article/Review

Parent Publication: ACS Applied Electronic Materials

Issue: 6