Performance and Reliability Review of 650 V and 900 V Silicon and SiC Devices: MOSFETs, Cascode JFETs and IGBTs (2020)
Attributed to:
Reliability, Condition Monitoring and Health Management Technologies for WBG Power Modules
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/tie.2019.2945299
Publication URI: http://dx.doi.org/10.1109/tie.2019.2945299
Type: Journal Article/Review
Parent Publication: IEEE Transactions on Industrial Electronics
Issue: 9