Nature of Cu Interstitials in Al 2 O 3 and the Implications for Filament Formation in Conductive Bridge Random Access Memory Devices (2016)

First Author: Dawson J
Attributed to:  Mechanisms and Control of Resistive Switching in Dielectrics funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1021/acs.jpcc.6b02728

Publication URI: http://dx.doi.org/10.1021/acs.jpcc.6b02728

Type: Journal Article/Review

Parent Publication: The Journal of Physical Chemistry C

Issue: 27