An Accurate Device for Apparent Emissivity Characterization in Controlled Atmospheric Conditions Up To 1423 K (2020)
Attributed to:
SEE MORE: SECONDARY ELECTRON EMISSION - MICROSCOPY FOR ORGANICS WITH RELIABLE ENGINEERING-PROPERTIES
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/tim.2019.2944504
Publication URI: http://dx.doi.org/10.1109/tim.2019.2944504
Type: Journal Article/Review
Parent Publication: IEEE Transactions on Instrumentation and Measurement
Issue: 7
ISSN: 1557-9662