Application of Clustering Filter for Noise and Outlier Suppression in Optical Measurement of Structured Surfaces (2020)

First Author: Lou S

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/tim.2020.2967571

Publication URI: http://dx.doi.org/10.1109/tim.2020.2967571

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Instrumentation and Measurement

Issue: 9