Total Dose Hardness of <formula formulatype="inline"> <tex Notation="TeX">${\rm TiN}/{\rm HfO}_{\rm x}/{\rm TiN}$</tex></formula> Resistive Random Access Memory (2014)
Attributed to:
Enabling microfocus & thin film X-ray scattering at the University of Southampton
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/tns.2014.2365058
Publication URI: http://dx.doi.org/10.1109/tns.2014.2365058
Type: Journal Article/Review
Parent Publication: IEEE Transactions on Nuclear Science
Issue: 6