Surface defects incorporated diamond machining of silicon (2020)
Attributed to:
HETEROSTRUCTURE RADIATION DETECTOR MATERIALS FOR ADVANCED TIME OF FLIGHT POSITRON EMISSION TOMOGRAPHY (TOF-PET) IMAGING
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/2631-7990/abab4a
Publication URI: http://dx.doi.org/10.1088/2631-7990/abab4a
Type: Journal Article/Review
Parent Publication: International Journal of Extreme Manufacturing
Issue: 4