Full Control of Polarization in Ferroelectric Thin Films Using Growth Temperature to Modulate Defects (2020)
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1002/aelm.202000852
Publication URI: http://dx.doi.org/10.1002/aelm.202000852
Type: Journal Article/Review
Parent Publication: Advanced Electronic Materials
Issue: 12