Full Control of Polarization in Ferroelectric Thin Films Using Growth Temperature to Modulate Defects (2020)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1002/aelm.202000852

Publication URI: http://dx.doi.org/10.1002/aelm.202000852

Type: Journal Article/Review

Parent Publication: Advanced Electronic Materials

Issue: 12