FinFET Versus Gate-All-Around Nanowire FET: Performance, Scaling, and Variability (2018)

First Author: Nagy D
Attributed to:  Modelling of Carrier Transport in Ultra Thin Body Transistors funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/jeds.2018.2804383

Publication URI: http://dx.doi.org/10.1109/jeds.2018.2804383

Type: Journal Article/Review

Parent Publication: IEEE Journal of the Electron Devices Society