Defect loss and its physical processes (2020)
Attributed to:
Time-Dependent Variability: A test-proven modelling approach for systems verification and power consumption minimization
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/icsict49897.2020.9278393
Publication URI: http://dx.doi.org/10.1109/icsict49897.2020.9278393
Type: Conference/Paper/Proceeding/Abstract