A fast and test-proven methodology of assessing RTN/fluctuation on deeply scaled nano pMOSFETs (2020)
Attributed to:
Time-Dependent Variability: A test-proven modelling approach for systems verification and power consumption minimization
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/irps45951.2020.9129230
Publication URI: http://dx.doi.org/10.1109/irps45951.2020.9129230
Type: Conference/Paper/Proceeding/Abstract