Application of Modern Scanning/Transmission Electron Microscope with Pixelated STEM Detector for Radiation Damage Study (2020)
Attributed to:
World Class Materials Facilities at the University of Huddersfield
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1017/s1431927620014506
Publication URI: http://dx.doi.org/10.1017/s1431927620014506
Type: Journal Article/Review
Parent Publication: Microscopy and Microanalysis
Issue: S2