Characterisation of negative-U defects in semiconductors. (2020)
Attributed to:
SuperSilicon PV: extending the limits of material performance
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/1361-648x/ab8091
PubMed Identifier: 32182607
Publication URI: http://europepmc.org/abstract/MED/32182607
Type: Journal Article/Review
Volume: 32
Parent Publication: Journal of physics. Condensed matter : an Institute of Physics journal
Issue: 32
ISSN: 0953-8984