E-TCT characterization of a thinned, backside biased, irradiated HV-CMOS pixel test structure (2021)

First Author: Franks M
Attributed to:  Development of HV-CMOS sensor technology for future tracking applications funded by STFC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.nima.2020.164949

Publication URI: http://dx.doi.org/10.1016/j.nima.2020.164949

Type: Journal Article/Review

Parent Publication: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment