Advanced data analysis procedure for hard x-ray resonant magnetic reflectivity discussed for Pt thin film samples of various complexity (2020)
Attributed to:
XMaS: The UK Materials Science Facility at the ESRF
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/1361-6463/ab8fdc
Publication URI: http://dx.doi.org/10.1088/1361-6463/ab8fdc
Type: Journal Article/Review
Parent Publication: Journal of Physics D: Applied Physics
Issue: 37