Enhancing hybrid metal-semiconductor systems beyond SERS with PIERS (photo-induced enhanced Raman scattering) for trace analyte detection (2020)

First Author: Glass D

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1117/12.2557517

Publication URI: http://dx.doi.org/10.1117/12.2557517

Type: Conference/Paper/Proceeding/Abstract