Thermal and oxidation stability of Ti x W 1- x diffusion barriers investigated by soft and hard x-ray photoelectron spectroscopy (2021)
Attributed to:
Multi-Scale Framework for Quantum Mechanical Simulations of Organic Electronics
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1063/5.0048304
Publication URI: http://dx.doi.org/10.1063/5.0048304
Type: Journal Article/Review
Parent Publication: Journal of Applied Physics
Issue: 19