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Persistence of Ferroelectricity Close to Unit-Cell Thickness in Structurally Disordered Aurivillius Phases (2020)

First Author: Keeney L

Attributed to: X-RAY DIFFRACTION CAPABILITY FOR NANOSCALE AND THIN FILM STRUCTURE funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1021/acs.chemmater.0c03454

Publication URI: http://dx.doi.org/10.1021/acs.chemmater.0c03454

Type: Journal Article/Review

Parent Publication: Chemistry of Materials

Issue: 24