Visualization of defects in nitride semiconductors by electron channeling (Conference Presentation) (2020)
Attributed to:
Quantitative non-destructive nanoscale characterisation of advanced materials
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1117/12.2544228
Publication URI: http://dx.doi.org/10.1117/12.2544228
Type: Conference/Paper/Proceeding/Abstract