Low-Pressure CVD of GeE (E = Te, Se, S) Thin Films from Alkylgermanium Chalcogenolate Precursors and Effect of Deposition Temperature on the Thermoelectric Performance of GeTe. (2021)

First Author: Robinson F
Attributed to:  Enabling microfocus & thin film X-ray scattering at the University of Southampton funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1021/acsami.1c14237

PubMed Identifier: 34606236

Publication URI: http://europepmc.org/abstract/MED/34606236

Type: Journal Article/Review

Volume: 13

Parent Publication: ACS applied materials & interfaces

Issue: 40

ISSN: 1944-8244