A nanoscale analysis method to reveal oxygen exchange between environment, oxide, and electrodes in ReRAM devices (2021)
Attributed to:
Structural dynamics of amorphous functional oxides - the role of morphology and electrical stress
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1063/5.0070046
Publication URI: http://dx.doi.org/10.1063/5.0070046
Type: Journal Article/Review
Parent Publication: APL Materials
Issue: 11