A sub-micron resolution, bunch-by-bunch beam trajectory feedback system and its application to reducing wakefield effects in single-pass beamlines (2021)
Attributed to:
The John Adams Institute for Accelerator Science
funded by
STFC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/1748-0221/16/01/p01005
Publication URI: http://dx.doi.org/10.1088/1748-0221/16/01/p01005
Type: Journal Article/Review
Parent Publication: Journal of Instrumentation
Issue: 01