Defect characterization of {101¯3} GaN by electron microscopy (2022)
Attributed to:
Time-resolved cathodoluminescence scanning electron microscope
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1063/5.0077084
Publication URI: http://dx.doi.org/10.1063/5.0077084
Type: Journal Article/Review
Parent Publication: Journal of Applied Physics
Issue: 3