Hallmark of quantum skipping in energy filtered lensless scanning electron microscopy (2022)

First Author: Thamm A

Attributed to: SEE MORE MAKE MORE: Secondary Electron Energy Measurement Optimised for Reliable Manufacture of Key Materials: Opportunity, Realisation, Exploitation funded by EPSRC

No abstract provided

Type: Journal Article/Review

Parent Publication: Applied Physics Letters

Issue: 5

ISSN: 00036951