Scanning Field Emission Microscopy with Spin and Energy Analysis (2021)

First Author: Thamm A

Attributed to: SEE MORE MAKE MORE: Secondary Electron Energy Measurement Optimised for Reliable Manufacture of Key Materials: Opportunity, Realisation, Exploitation funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/ivnc52431.2021.9600781

Publication URI: http://dx.doi.org/10.1109/ivnc52431.2021.9600781

Type: Conference/Paper/Proceeding/Abstract