The effect of work function during electron spectroscopy measurements in Scanning Field-Emission Microscopy. (2022)
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.ultramic.2022.113547
PubMed Identifier: 35545000
Publication URI: http://europepmc.org/abstract/MED/35545000
Type: Journal Article/Review
Volume: 238
Parent Publication: Ultramicroscopy
ISSN: 0304-3991