Bias Temperature Instability of MOSFETs: Physical Processes, Models, and Prediction (2022)
Attributed to:
Time-Dependent Variability: A test-proven modelling approach for systems verification and power consumption minimization
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.3390/electronics11091420
Publication URI: http://dx.doi.org/10.3390/electronics11091420
Type: Journal Article/Review
Parent Publication: Electronics
Issue: 9