Edge termination in vertical GaN diodes: Electric field distribution probed by second harmonic generation (2022)

First Author: Cao Y
Attributed to:  Sub-micron 3-D Electric Field Mapping in GaN Electronic Devices funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/5.0096755

Publication URI: http://dx.doi.org/10.1063/5.0096755

Type: Journal Article/Review

Parent Publication: Applied Physics Letters

Issue: 24