Bias Temperature Instability of MOSFETs: Physical Processes, Models, and Prediction (2022)

First Author: Zhang J
Attributed to:  Variability-aware RRAM PDK for design based research on FPGA/neuro computing funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.3390/electronics11091420

Publication URI: http://dx.doi.org/10.3390/electronics11091420

Type: Journal Article/Review

Parent Publication: Electronics

Issue: 9