Scanning ion-conductance microscopy technique for studying the topography and mechanical properties of Candida parapsilosis yeast microorganisms. (2023)
Attributed to:
New generation of biosensors using nanopore extended Field Effect Transistors (NexFET)
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1039/d2bm00964a
PubMed Identifier: 36477151
Publication URI: http://europepmc.org/abstract/MED/36477151
Type: Journal Article/Review
Volume: 11
Parent Publication: Biomaterials science
Issue: 2
ISSN: 2047-4830