Metrology of complex refractive index for solids in the terahertz regime using frequency domain spectroscopy (2019)
Attributed to:
Atomically Deterministic Doping and Readout For Semiconductor Solotronics (ADDRFSS)
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/irmmw-thz.2019.8873778
Publication URI: https://api.elsevier.com/content/abstract/scopus_id/85074704006
Type: Conference/Paper/Proceeding/Abstract