Surface modification and porosimetry of vertically aligned hexagonal mesoporous silica films (2016)

First Author: Robertson C
Attributed to:  Enabling microfocus & thin film X-ray scattering at the University of Southampton funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1039/c6ra23059h

Publication URI: https://api.elsevier.com/content/abstract/scopus_id/85002961326

Type: Journal Article/Review

Parent Publication: RSC Advances

Issue: 114