A new Gaussian process-based approach for uncertainty propagation in surface metrology profile parameters estimation (2019)

First Author: Obajemu O.

Attributed to: Manufacturing Fellowship Extension in: Controlling geometrical variability of products in the digital and smart manufacturing era funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Publication URI: https://api.elsevier.com/content/abstract/scopus_id/85071039405

Type: Other

Parent Publication: European Society for Precision Engineering and Nanotechnology, Conference Proceedings - 19th International Conference and Exhibition, EUSPEN 2019